Dr. Mehmet Yilmaz is a principal investigator (PI) at National Nanotechnology Research Center (UNAM) at Bilkent University. In spirit, he is an academician, scientist, engineer, inventor, and entrepreneur.
Mehmet Yilmaz received the B.S. degree (with high honors) from Izmir Institute of Technology, the M.S. degree from Koc University, and the Ph.D. degree from Columbia University, all in mechanical engineering. After his Ph.D. degree studies, he joined IBM Microelectronics Division at Albany Nanotechnology Research and Development Center, in New York, Albany.
During his M.S. and Ph.D. degree studies, Mehmet Yilmaz specialized in design and microfabrication of MEMS and integration of MEMS with nanostructures. During his Ph.D. degree studies, he also specialized in nanomechanical characterization of materials in-situ scanning electron microscope (SEM). During his time at IBM Microelectronics Division, he worked on developing reactive ion etching (RIE) processes for via patterning, and developing new integration schemes for 10 nm and 7 nm technology nodes, and silicon 3D integration (3Di) technologies. He is a co-inventor of two U.S. patents from the research and development efforts during his time at IBM.
Mehmet Yilmaz is interested in mechanical characterization, elastic strain engineering, understanding, and tuning the material properties at small length scales for energy and information technology applications, and developing new unit processes and integration processes for batch-compatible nanofabricated, high yield, MEMS and NEMS devices for energy, information technology, and health applications.